ISA Process Analytical Technology Conference Tutorial & Exhibition
Description:The ISA PAT Conference and Exhibition offers conference topics designed to help those working in the manufacturing environment understand systems for designing, analyzing, and controlling manufacturing through the timely measurement of critical performance attributes of materials and processes to ensure final product quality. The symposium also includes an educational ISA tutorial for those looking to locate and utilize online options to assist them with PAT. Why You Should Attend:
General Information:
Tutorial: Overview of On-Line Process Analytical Technology ToolsThis half day seminar will serve as the kick off for this PAT event. It will introduce a large variety of commercially available on-line composition, component, and property measuring concepts that are currently available for use in PAT applications and some of the support systems that they utilize and/or require. Properly utilizing their real time data can assist you in verifying and improving product quality, improving process control and stability, improving process capacities and efficiencies, increased safety, and more. This technology overview should provide enough examples to get you thinking and help set the stage for the remainder of this conference. Instructor: James F. TateraJames F. Tatera’s online process analysis experience includes over 27 years with a major international chemical company and over four years consulting through his own firm and others. This experience includes both US and International assignments in analytical research, process engineering, project engineering, production management, and maintenance management. He is one of the original Certified Specialists in Analytical Technology (CSAT). Registration Prices:
Download the Registration Form (PDF) Venue:Holiday Inn National Airport Rate: Request the ISA PAT Conference rate of $169 until 20 October 2008 Exhibiting and Sponsorship:
The last day to pre-register online is November 6, 2008. |
