ISA Process Analytical Technology Conference Tutorial & Exhibition

Description:

The ISA PAT Conference and Exhibition offers conference topics designed to help those working in the manufacturing environment understand systems for designing, analyzing, and controlling manufacturing through the timely measurement of critical performance attributes of materials and processes to ensure final product quality. The symposium also includes an educational ISA tutorial for those looking to locate and utilize online options to assist them with PAT.

Why You Should Attend:

• Understand industry regulations: Analyze and review compliance regulations and automatic systems
• Expand plant capabilities: Understand how to utilize PAT techniques for process control
• Identify market opportunities: Find the latest process and end point monitoring controls and tools
• Enjoy an interactive environment: Join the Q&A panel focused on three emerging technologies supportive of the PAT initiative: Wireless Technology, RFID, and Cyber Security
• Hear presentations on unique conference topics: Learn the FDA’s recommended practices (supported by ISA) for implementing the PAT initiative

General Information:

• Conference Brochure/Agenda (PDF)
• Call for Papers (PDF)
• ISA Tutorial
• Pricing and Registration
• Location, Lodging, & Transportation
• Exhibiting and Sponsorship

Tutorial: Overview of On-Line Process Analytical Technology Tools

This half day seminar will serve as the kick off for this PAT event. It will introduce a large variety of commercially available on-line composition, component, and property measuring concepts that are currently available for use in PAT applications and some of the support systems that they utilize and/or require. Properly utilizing their real time data can assist you in verifying and improving product quality, improving process control and stability, improving process capacities and efficiencies, increased safety, and more. This technology overview should provide enough examples to get you thinking and help set the stage for the remainder of this conference.

Instructor: James F. Tatera

James F. Tatera’s online process analysis experience includes over 27 years with a major international chemical company and over four years consulting through his own firm and others. This experience includes both US and International assignments in analytical research, process engineering, project engineering, production management, and maintenance management. He is one of the original Certified Specialists in Analytical Technology (CSAT).

Registration Prices:

• ISA Member: $595
• Non–member: $695
• Group Rates Available

Download the Registration Form (PDF)

Venue:

Holiday Inn National Airport

Phone: 703-684-7200

Rate: Request the ISA PAT Conference rate of $169 until 20 October 2008

Exhibiting and Sponsorship:

• Exhibitor Contract (PDF)
• Exhibitor Flyer (PDF)