Title:
X-ray diffraction measurement
Supplier:
Meller Optics
www.melleroptics.com
www.melleroptics.com
Date Submitted:
Nov 17, 2010
Rated:
X-ray diffraction measurement
The X-Ray Single-Crystal Diffraction Analysis employs x-Ray diffraction goniometry to measure a specific sample plane as requested by the customer and provide a flat reference with accuracy up to 2-3 arc-minutes. Suitable for samples from 0.25” sq. and up of materials such as sapphire, single crystal quartz, silicon, MgF2, CaF2, BaF2, and spinel, the firm can also correct a plane and provide a reference flat.ISA Partner Spotlight
Read questions answered by our experts or join the email list.
All contents copyright of ISA © 1995-2012 All rights reserved.