X-ray diffraction measurement
Nov 17, 2010
X-ray diffraction measurementThe X-Ray Single-Crystal Diffraction Analysis employs x-Ray diffraction goniometry to measure a specific sample plane as requested by the customer and provide a flat reference with accuracy up to 2-3 arc-minutes. Suitable for samples from 0.25” sq. and up of materials such as sapphire, single crystal quartz, silicon, MgF2, CaF2, BaF2, and spinel, the firm can also correct a plane and provide a reference flat.
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