XL-80 laser calibration system
Oct 15, 2009
XL-80 laser calibration systemLean-design XL-80 laser calibration system offers a compact system measures at 4 m/s, raises environmentally-corrected accuracy to ±0.5 ppm, warms up faster, weighs less, and transports easier. The design allows a 4X faster slew rate, 10X higher dynamic data capture rate, and industry’s best total system accuracy in a smaller, lighter, and more portable package. The XL-80 provides a resolution of 1 nm, even at top speed. The warm-up time, less than six minutes, minimizes waits to increase available measurement time. The XL-80 brings nanometer-level motion analysis to calibration, error-mapping, and compensation of everything from laboratory equipment, semi-conductor processing machinery, and radiosurgery tools to coordinate measuring machines, lithography equipment, advanced machine tools, robots, and assembly systems. A new signal gain switch gives the option of 80 m linear range (such as for large aircraft profilers) or increased signal strength at shorter ranges. The XL-80 system is backward compatible with optics from Renishaw’s ML10 laser system, enabling thousands of current ML10 users to upgrade to the new system while retaining their investment in optics, procedures, and staff training. A full range of optics enables highest precision interferometer determination of a machine’s linear, angular, flatness, straightness, and squareness measurements to international checking standards. System accuracy of ±0.5 ppm is maintained over the full operating range of 0-40°C (32°-104°F). A new XC-80 Intelligent Sensor System maintains that accuracy against variations in temperature, pressure, and humidity by updating the environment factor every seven seconds via a USB link. As with the ML10, all measurements are based on the wavelength of a stabilized HeNe laser source, giving users assured traceability back to internationally recognized length standards.
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